Category: ARC News

New TEM Training Format

ARC is launching a new structured TEM training format beginning April 1. Students interested in becoming independent operators of the JEOL 2100 TEM can now sign up directly for TEM training in iLab. The updated format includes four foundational lectures taught by Dr. Roy Geiss, covering the basics of TEM imaging, electron diffraction, EDS, and […]

XRDynamic 500 now online

ARC’s new Anton Paar XRDynamic 500 is installed and ready for use. Staff training is complete, and user training can now be requested through iLab. The XRD system supports powder and thin-film analysis (GIXRD, XRR), in-operando battery studies, PDF analysis, and SAXS, expanding ARC’s capabilities for advanced materials characterization.

New multifunctional XRD coming to the ARC!!

New multifunctional XRD coming to the ARC!! We are pleased to announce that the ARC (with support from the OVPR) has recently purchased a new multipurpose x-ray diffractometer from Anton Paar! The new XRDynamic 500 will be installed in early 2026 and is expected to be operational by February. This instrument will come equipped with copper and […]

Technician work with the XR Dynamic 500 instrument

FTIR Microscope!

New FTIR Microscope Now Available in the ARC! We’re excited to announce the arrival of the PerkinElmer Spotlight 400 FTIR Microscope! This powerful tool combines infrared spectroscopy with microscopy to enable chemical imaging and microstructure analysis of materials at the micron scale, ideal for studying polymers, microplastics, coatings, fibers, thin films, and other heterogeneous samples. […]

FTIR Microscope