Surface Analysis
The Surface Analysis Laboratory at ARC provides high-resolution chemical and topographical characterization of solid materials for researchers in the physical sciences, engineering, manufacturing, and more.
Services:
- Surface Chemistry & Elemental Composition – Determines elemental identities, chemical states, and electronic structure of surfaces (~10 nm depth).
- Surface Topography & Thickness Measurement – Measures surface roughness, texture, step heights, and thin-film thickness.
Users can receive training for independent instrument operation or request full-service support. Our team also offers collaborative research and consultation, assisting with experimental design, data interpretation, and method optimization.
Instruments:
- PHI PE-5800 Xray photoelectron spectrometer (XPS) – Elemental composition, chemical states, and electronic structure analysis (top 10 nm).
- Monochromatic Al Kα X-ray source.
- Ion sputtering for depth profiling.
- Charge neutralization.
- Bruker DektakXT Stylus Profilometer – High-precision surface profiling measurement.
- 2D and 3D mapping, customizable scan settings, and nanometer-scale roughness analysis.
Contact: Rebecca Miller
