Recurring Courses:

    • NSCI 677: Microscopic Image Collection & Processing. Taught by Dr. Jeff Field.
    • NSCI 693D: Graduate Seminar: Microscopy. Taught by Dr. Jeff Field.
    • Transmission Electron Microscopy: Taught by Dr. Roy Geiss. A practical 7-week graduate-level short course that provides intensive hands-on training on the JEM-2100F transmission electron microscope.

Hands-on Lab Sections:

    • MSE 502C (SAMD): Materials Science & Engineering Methods: Materials Microscopy. ARC-ISS role: hands-on learning on the SEM and TEM.
    • MSE 502D (SAMD): Materials Science & Engineering Methods: Materials Spectroscopy. ARC-ISS role: hands-on learning on XPS and EDS.
    • Chem 381: Nanochemistry. ARC-ISS role: electron microscopy of inorganic particulate products (TEM, SEM).

Guest Lectures:

    • ECE 457: Fourier Optics
    • ECE 518: Biophotonics
    • ECE 547: Biomedical Signal Processing
    • ECE 581B7: Advanced Optical Imaging
    • CM 510: Intro to Cell and Molecular Biology
    • CM 702E: Methods in Cellular & Molecular Biology: Flow Cytometry and Cell Sorting
    • ECOL 592: The Science of Ecosystem Measurement, Taught by Dr. Claudia Boot of ARC-MMA, guest Q&A lecture with Dr. Roy Geiss, Dr. Jeff Field, and Dr. Rebecca Miller.

Past Courses:

This 2-day workshop  introduced different methods of identifying and refining twinned X-ray and electron diffraction. The workshop was composed of lectures, hands-on data processing and structure solution and refinement

  • DAY 1: Electron diffraction (Dr. Roy Geiss, Dr. Rebecca Miller, and Dr. Michael Ruf)
  • DAY 2: X-ray diffraction (Dr. Michael Ruf and Dr. Brian Newell)

Participants will be provided with software to explore the methods used to help identify and refine twinned structures. *Windows 7 or 10 Professional (x64) is required*

October 2-3, 2018. Two day short course, with lectures and hands-on labs, will cover qualitative and quantitative energy dispersive spectroscopy in both TEM and SEM plus an introduction to DTSA-II. Registration Fees: Students $200, Non-Students $300.  The short course will be followed by a free one day workshop on October 4 with lectures and demos covering both in-situ experiments using the Protochips Fusion heating sample holder in the TEM and ‘Chemistry and Crystallography’ with EDS and EBSD, using the Oxford UltimMax 170 EDS and new Symmetry EBSD in the SEM.

The 2015 CIF Summer School consisted of a 3-day workshop meant to introduce participants to different electron diffraction methods for micro-structuralcrystallographic characterization of materials in scanning and transmission electron microscopy.

  • Day 1: Conventional diffraction meodes in TEM (SAED, NBD, CBED)
  • Day 2: Precession electron diffraction and crystallography
  • Day 3: Electron backscatter diffraction in SEM

The school was open to both CSU and non-CSU students, researchers and professionals in the field.
Sponsors included JEOL, NanoMEGAS, EDAX and Gatan.

The 2014 CIF Summer School consisted of two 5-day, 1-credit courses, with subjects in applied materials analysis, including surface characterization, thin film, crystal, powder and solid X-ray, spectroscopic and microscopic analyses:

  • Session 1 (CHEM 651B): Electron Microscopy: May 19-23, 2014
  • Session 2 (CHEM 651A): Materials Analysis: June 2-6, 2014

Students obtained practical understanding of which instrumental methods to use for characterizing different types of materials, and how to derive morphological, structural and compositional information at different scales.
Sponsors included JEOL USA Inc, Topspin and PANalytical.
School features 

  • Cooperative learning of individual techniques through lecture & laboratory instruction.
  • Discussion of sample handling, sample preparation, etc. for different techniques and sample types.
  • Exposure and hands-on experience with new state-of-the art instrumentation and technology used routinely in materials analysis, including X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), profilometry, contact angle, high resolution scanning electron microscopy (SEM) and transmission electron microscopy (TEM) imaging, energy dispersive X-ray spectroscopy (EDS), precession electron diffraction (PED), tomography and electron backscatter diffraction (EBSD).
  • Application highlights keynote lectures by prominent research scientists in the field.
  • ‘PICO’ presentations (2-slides/2-minutes) by course participants about EM and materials analysis applications in their research.