Surface Science & Spectroscopy
The Surface Analysis & Spectroscopy Lab is a research and service facility, serving the biological and materials research communities at CSU. It is open to university, state, and outside users. It houses an X-ray photoelectron spectrometer, a profilometer, contact angle goniometer, and an ellipsometer. Various chemical and material properties such as elemental identities, chemical states, thickness, surface roughness, and hydrophilicity can be investigated.
The facility offers either training or full-service data collection on each of these instruments for instrument access and staff time fees. X-ray photoelectron spectroscopy provides elemental identities and chemical states for the surfaces (~10 nm depth) of solid samples. The instrument is also equipped with ultraviolet photoelectron spectroscopy capabilities. The stylus profilometer allows measurement of a material’s surface profile and roughness. Measuring steps can provide film thickness. The contact angle goniometer measures contact angles via the sessile drop technique. The instrument allows measurement of static contact angles or time-dependent contact angles on flat substrates using a wide variety of probe liquids. The Woolam Variable Angle Spectroscopic Ellipsometer (VASE) holds the following measurement capabilities: reflection and transmission ellipsometry, generalized ellipsometry (anisotropy, retardance, birefringence), reflectance (R) and transmittance (T) intensity, and cross-polarized R/T.
Please use the iLab Portal to request training or services and access the instrument calendars.
PHI Physical Electronics PE-5800 X-ray Photoelectron Spectrometer
X-ray photoelectron spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a technique to investigate the chemical composition of solid surfaces (elemental identity, chemical state, and semi-quantitative elemental analysis). This technique can also provide useful information about depth profile and thickness. The instrument is also equipped for ultraviolet photoelectron spectroscopy.
Bruker DektakXT Stylus Profilometer
The Bruker DektakXT Stylus Profilometer is a step height measurement tool for profiling surface topography and roughness in the nanometer range. The profilometer is capable of two-dimensional surface profile measurements as well as 3D mapping. Variables that can be tuned for measurements include the scan length or area, speed, and stylus force.
KRÜSS DSA10 Drop Shape Analysis System Contact Angle Goniometer
The contact angle goniometer (CAG) measures contact angles via the sessile drop technique. The instrument allows measurement of static contact angles or time-dependent contact angles on flat substrates using a wide variety of probe liquids.
Woolam Variable Angle Spectroscopic Ellipsometer
The VASE® is a versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range – 193 to 3200 nm. Variable wavelength and angle of incidence allow flexible measurement capabilities, including reflection and transmission ellipsometry, generalized ellipsometry (anisotropy, retardance, birefringence), reflectance (R) and transmittance (T) intensity, and cross-polarized R/T.
Dr. Rebecca Miller: contact for services and training on the XPS, profilometer, CAG, and ellipsometer.