The Surface Analysis & Spectroscopy Lab is a research and service facility, serving the biological and materials research communities at CSU. It is open to university, state, and outside users. It houses an X-ray photoelectron spectrometer and a profilometer. Various chemical and material properties such as elemental identities, chemical states, and surface roughness can be investigated.

The facility offers either training or full-service data collection on each of these instruments for instrument access and staff time fees. X-ray photoelectron spectroscopy provides elemental identities and chemical states for the surfaces (~10 nm depth) of solid samples. The instrument is also equipped with ultraviolet photoelectron spectroscopy (UPS) capabilities. The stylus profilometer allows measurement of a material’s surface profile and roughness. Measuring steps can provide film thickness.

Please use the iLab Portal to request training or services and access the instrument calendars.

PHI Physical Electronics PE-5800 X-ray Photoelectron Spectrometer

X-ray photoelectron spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a technique to investigate the chemical composition of solid surfaces (elemental identity, chemical state, and semi-quantitative elemental analysis). This technique can also provide useful information about depth profile and thickness. The instrument is also equipped for ultraviolet photoelectron spectroscopy.

Bruker DektakXT Stylus Profilometer

The Bruker DektakXT Stylus Profilometer is a step height measurement tool for profiling surface topography and roughness in the nanometer range. The profilometer is capable of two-dimensional surface profile measurements as well as 3D mapping. Variables that can be tuned for measurements include the scan length or area, speed, and stylus force.

Please see our Rates webpage for pricing information.

CasaXPS software for processing XPS data

NIST XPS Database

XPS/AES Tables

Coming soon!