X-ray Diffraction

The X-ray Diffraction laboratory has tools for studying surface layers or thin film structures, single crystals, powders, and solids. Information about crystallites, absolute stereochemistry, domain sizes, defects, surface thickness and roughness, and chemical composition may be obtained. Instruments can do X-ray diffraction, X-ray reflection and X-ray scattering.

  • X-ray diffraction and scattering measurements
  • Hands-on education in the use and application to assess structural properties of thin films, solids, and nanoparticles
  • Bench and fume hood space to prepare the samples
  • Collaborative research opportunities
  • Data interpretations and recommendations
  • Full-service and self-service options
  • Support in academic courses
  • Specialized workshops

Powder

  • Bruker D8 Discover DaVinci: Precise and non-destructive X-ray analysis that affords qualitative and quantitative phase analysis, and characterization of various properties such as particle size, strain, and stress of polycrystalline samples. CuKα radiation, LYNXEYE-XE-T energy discriminating detector, Nine position sample changer with Phi rotation, and Electrochemical cell for in situ experiments.

Thin Film

  • Bruker D8 Discover Series II: Precise and non-destructive X-ray diffraction analysis of thin films and multi-layered structures. Parabolic Göbel mirror and ¼-circle Eulerian cradle. Measurement types include:
    • X-ray Reflectivity (XRR) – determination of thickness, density, or roughness of thin films and multilayers
    • Glancing Angle X-ray Diffraction (GAXRD) – low incident angles maximize the signal from thin layers as well as offering depth profiling of the phase composition of layers
    • Residual Stress and Texture Analysis of thin films

Single Crystal

  • Bruker Kappa APEXII: Non-destructive technique that provides precise information about 3-D molecular and crystal structures of small molecule single-crystals.
    • Cu Kα radiation
    • Provides detailed information about the internal lattice of crystalline substances  unit cell dimensions, bond lengths, bond angles, and details of site-ordering
  • Bruker D8 Advance QUEST: Non-destructive technique that provides precise information about 3-D molecular and crystal structures of small molecule single-crystals. Located in CHEMR.
    • Mo Kα radiation
    • Provides detailed information about the internal lattice of crystalline substances  unit cell dimensions, bond lengths, bond angles, and details of site-ordering
    • Features a Photon 50™ CMOS detector which is capable of high speed data collection in shutterless operation mode

Small Angle/Wide Angle Scattering

  • Rigaku Wide Angle X-ray Scattering (WAXS)/Small Angle X-ray Scattering (SAXS): For determining shape and size of macromolecules and characterization of block co-polymers.
    • Cu rotating anode
    • DECTRIS PILATUS 3R 300K detector
    • Characteristic distances of partially ordered materials, pore sizes, and other data
    • Structural information of macromolecules between 5 and 25 nm of repeat distances in partially ordered systems up to 150 nm

For Training on self-service instruments:

  • Request to join the ARC User Team by clicking here
  • Please read our ARC user guidelines and take the necessary quizzes.
  • Then follow the training and user instructions on the XRD Training.

Training has a minimum charge of one hour of instrument and staff time.

Rates can be found here

Please use the iLab Portal to request a formal quote for equipment use or services.

Additional Information

checkCIF

X-ray Data Booklet

International Tables for Crystallography

International Centre for Diffraction Data – Tutorials

Suggested Readings

High Resolution X-ray Scattering from Thin Films and Multilayers,V. Holy, U. Pietsch, T. Baumbach, Springer Tracts in Modern Physics

Residual Stress Measurements by Diffraction and Interpretation , I.C. Noyan, J.B. Cohen, Springer-Verlag

High Resolution X-Ray Diffractometry and Topography D. K. Bowen , B. K. Tanner, Taylor and Francis

Acknowledgment of facility contributions is expected in publications that include any data generated in the facility. Please cite us by our Research Resource ID (RRID:SCR_021758).

An example of an appropriate acknowledgment is:

“The authors wish to thank the Analytical Resources Core (RRID: SCR_021758) at Colorado State University for instrument access, training, and assistance with sample analysis”

 

SCXRD Co-Authorship Policy
Data Management Policy

Scientific Staff:

Dr. Ethan Crace: Small molecule X-ray crystallography, X-ray diffraction services, training, and class support.