X-ray Diffraction

Please use the CIF iLab Portal to request training and schedule time on instruments.

The X-ray Diffraction laboratory has tools for studying surface layers or thin film structures, single crystals, powders, and solids. Information about crystallites, absolute stereochemistry, domain sizes, defects, surface thickness and roughness, and chemical composition may be obtained. Instruments can do X-ray diffraction, X-ray reflection and X-ray scattering.

NOTE: There is a minimum charge per project. Collaborative efforts are encouraged.

Contact the Diffraction team for more information.

Powder

Precise and non-destructive X-ray analysis that affords qualitative and quantitative phase analysis, and characterization of various properties such as particle size, strain, and stress of polycrystalline samples.

  • CuKα radiation
  • LYNXEYE-XE-T energy discriminating detector
  • Nine position sample changer with Phi rotation
  • Electrochemical cell for in situ experiments

Beam time: $8/hr

  • $2 minimum charge per use
  • $24 minimum charge per billing cycle

Precise and non-destructive X-ray analysis that affords qualitative and quantitative phase analysis, and characterization of various properties such as particle size, strain, and stress of polycrystalline samples.

  • Parabolic Göbel mirror
  • LYNXEYE Energy Discriminating Detector
  • HTK-1200N temperature stage w/ capillary extension

Beam time:$20/hr

  • $10 minimum charge per use
  • $100/day for Day rate (>5 hrs)
  • 3 hour minimum charge per billing cycle

Thin Film

Precise and non-destructive X-ray diffraction analysis of thin films and multi-layered structures.

  • Parabolic Göbel mirror
  • ¼-circle Eulerian cradle

Measurement types include:

  • X-ray Reflectivity (XRR) – determination of thickness, density, or roughness of thin films and multilayers
  • Glancing Angle X-ray Diffraction (GAXRD) – low incident angles maximize the signal from thin layers as well as offering depth profiling of the phase composition of layers
  • Residual Stress and Texture Analysis of thin films

Beam time:$30/hr

  • $15 minimum charge per use
  • 5 hour minimum charge per billing cycle

Single Crystal

Non-destructive technique that provides precise information about 3-D molecular and crystal structures of small molecule single-crystals.

  • MoKα radiation (Optional CuKα source available upon request)
  • Provides detailed information about the internal lattice of crystalline substances  unit cell dimensions, bond lengths, bond angles, and details of site-ordering

Beam time:  $60/hr

  • $15 minimum charge per use
  • $60 minimum charge per billing cycle

Single Crystal Structure Determination Services (e.g. data collection/data reduction):

Full:  $450

Assisted:  $270

Self:  $180

Non-destructive technique that provides precise information about 3-D molecular and crystal structures of small molecule single-crystals. Located in CHEMR.

  • MoKα radiation
  • Provides detailed information about the internal lattice of crystalline substances  unit cell dimensions, bond lengths, bond angles, and details of site-ordering
  • Features a Photon 50™ CMOS detector which is capable of high speed data collection in shutterless operation mode

Beam time:  $17/hr

  • $17 minimum charge per use
  • $50 minimum charge per billing cycle

Single Crystal Structure Determination Services (e.g. data collection/data reduction):

  • Full: $450
  • Assisted: $270
  • Self: $180

Small Angle/Wide Angle Scattering

For determining shape and size of macromolecules and characterization of block co-polymers.

  • Cu rotating anode
  • 2D multi-wire detector
  • Characteristic distances of partially ordered materials, pore sizes, and other data
  • Structural information of macromolecules between 5 and 25 nm of repeat distances in partially ordered systems up to 150 nm

$10/hr

  • $25 minimum charge per use
Dr. Brian Newell

Dr. Brian Newell
Research Scientist II
Lab Manager, Materials Analysis
CIF, Chemistry, C1D
(970) 491-6209
Brian.Newell@colostate.edu

Additional Information

Suggested Readings

High Resolution X-ray Scattering from Thin Films and Multilayers,V. Holy, U. Pietsch, T. Baumbach, Springer Tracts in Modern Physics

Residual Stress Measurements by Diffraction and Interpretation , I.C. Noyan, J.B. Cohen, Springer-Verlag

High Resolution X-Ray Diffractometry and Topography D. K. Bowen , B. K. Tanner, Taylor and Francis