The Imaging and Surface Science laboratory has several tools for examining materials and can provide high resolution (angstrom to micron scale), detailed pictures of surfaces and thin films, micro-structural crystallographic information (from electron diffraction data), and X-ray spectral data including elemental analysis of small features.

NOTE:  Use of the TEM requires additional assistance and training due to the complexity of the instrument. Please contact the Imaging and Surface Science Team for more details.

NOTE: There is a minimum charge per project. Collaborative efforts are encouraged.

Contact the Imaging and Surface Science team for more information.