New Thin-Film capabilities in the CIF
Dr. Jamie Neilson was responsible for a C-Cubed proposal to acquire a newer Bruker D8 Series II Thin-Film XRD.
This acquisition comes with a newer goniometer and added features that will enhance the capabilities of the thin-film measurements in the CIF. Added features include:
- Rotary Absorber
- complete XRR scans can be collected without the need to perform two separate scans
- seamless acquisition of high-intensity data without comprising quantitative information
- Various X-ray snouts to produce a point-source X-ray beam instead of the traditional line-source (allowing more control of sample size and location of analysis for thin-film samples)
For more information, please contact Dr. Brian Newell – Brian.Newell@colostate.edu