New Thin-Film capabilities in the CIF

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Dr. Jamie Neilson was responsible for a C-Cubed proposal to acquire a newer Bruker D8 Series II Thin-Film XRD. 

This acquisition comes with a newer goniometer and added features that will enhance the capabilities of the thin-film measurements in the CIF.  Added features include:

  • Rotary Absorber
    • complete XRR scans can be collected without the need to perform two separate scans
    • seamless acquisition of high-intensity data without comprising quantitative information
  • Various X-ray snouts to produce a point-source X-ray beam instead of the traditional line-source (allowing more control of sample size and location of analysis for thin-film samples)

For more information, please contact Dr. Brian Newell –

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